CULT: A unified framework for tracing and logging c-based designs

Resource type
Conference
Author(s)
Hong, Wei and Viehl, Alexander and Bannow, Nico and Kerstan, Christian and Post, Hendrik and Bringmann, Oliver and Rosenstiel, Wolfgang
Year
2012
Pages
1--6
Book title
System, Software, SoC and Silicon Debug Conference (S4D), 2012
Organization
IEEE
Download .bib
Download .bib
Published by
Alexander Viehl