CULT: A unified framework for tracing and logging c-based designs

Publikationstyp
Konferenz
Autor(en)
Hong, Wei and Viehl, Alexander and Bannow, Nico and Kerstan, Christian and Post, Hendrik and Bringmann, Oliver and Rosenstiel, Wolfgang
Jahr
2012
Seiten
1--6
Buchtitel
System, Software, SoC and Silicon Debug Conference (S4D), 2012
Organisation
IEEE
Download .bib
Download .bib
Eingetragen von
Alexander Viehl